Although SEM is a well-established technique for characterizing nanomaterials, such as nanoparticles, it has been used lately to characterize samples that have macroscopic physical dimensions, such as electrode surfaces, ultramicroelectrodes (UME), nanoelectrodes and nanopipettes. Scanning Electron Microscopy (SEM) is a powerful analytical tool for studying chemical composition, material structure and morphology on the submicron level and thus has been widely used to characterize new materials with a broad applications spectrum. The funders had no role in study design, data collection and analysis, decision to publish, or preparation of the manuscript.Ĭompeting interests: The authors have declared that no competing interests exist. This is an open access article distributed under the terms of the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original author and source are credited.ĭata Availability: All relevant data are within the paper and its Supporting Information files.įunding: The research upon which this article was based was supported by Conselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq: grant number 48383/2012-2 for GNM) and FAPESP (Fundação de Amparo à Pesquisa do Estado de São Paulo, grant number 2015/20776-9), to which the authors are very grateful for the financial support. Received: MaAccepted: JPublished: July 28, 2017Ĭopyright: © 2017 Meloni, Bertotti. PLoS ONE 12(7):Įditor: Yogendra Kumar Mishra, Institute of Materials Science, GERMANY Citation: Meloni GN, Bertotti M (2017) 3D printing scanning electron microscopy sample holders: A quick and cost effective alternative for custom holder fabrication.
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